Part Number
Part Number:
NSN:
NIIN:
Item Name:
TEST SET , SEMICONDUCTOR DEVICE
Definition:
A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.
CAGE Information
Code | Company |
---|---|
57705 | HUNTRON INC DBA HUNTRON INSTRUMENTS |
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
ABGL | WIDTH | 11.600 INCHES NOMINAL |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
HGTH | HEIGHT | 4.500 INCHES NOMINAL |
AQXY | TEST TYPE FOR WHICH DESIGNED | TROUBLESHOOTING |
AEJZ | DEPTH | 15.000 INCHES NOMINAL |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | PROTRACK I |